Author ORCID Identifier


Date of Award


Document Type

Honors Thesis

Degree Name

Bachelor of Science, BS




Physics Department

Faculty Advisor

Polievkt Perov

Second Advisor

Walter Johnson

Third Advisor

Stevan Radojev


Scanning Probe Microscopy (SPM) has become a critical tool for characterization of materials in fields such as physics, material science, chemistry, and biology. Atomic Force Microscopy (AFM) is an increasingly useful technique because of its high resolution in three dimensions, the sample does not need to be conductive, and the technique does not need to take place in vacuum. AFM can image a wide variety of topographies and many different types of materials. AFM can deliver 3D topography information from the angstrom level to the micron scale with high resolution. One of the most important aspects of Atomic Force Microscopy that is not often discussed is data processing and analysis. The goal of this report is to demonstrate various data processing and analysis techniques such as studying the coating process, grain analysis, texture analysis and surface roughness.



To view the content in your browser, please download Adobe Reader or, alternately,
you may Download the file to your hard drive.

NOTE: The latest versions of Adobe Reader do not support viewing PDF files within Firefox on Mac OS and if you are using a modern (Intel) Mac, there is no official plugin for viewing PDF files within the browser window.