Author ORCID Identifier
0000-0002-0096-6062
Date of Award
12-2020
Document Type
Honors Thesis
Degree Name
Bachelor of Science, BS
School
CAS
Department
Physics Department
Faculty Advisor
Polievkt Perov
Second Advisor
Walter Johnson
Third Advisor
Stevan Radojev
Abstract
Scanning Probe Microscopy (SPM) has become a critical tool for characterization of materials in fields such as physics, material science, chemistry, and biology. Atomic Force Microscopy (AFM) is an increasingly useful technique because of its high resolution in three dimensions, the sample does not need to be conductive, and the technique does not need to take place in vacuum. AFM can image a wide variety of topographies and many different types of materials. AFM can deliver 3D topography information from the angstrom level to the micron scale with high resolution. One of the most important aspects of Atomic Force Microscopy that is not often discussed is data processing and analysis. The goal of this report is to demonstrate various data processing and analysis techniques such as studying the coating process, grain analysis, texture analysis and surface roughness.
Recommended Citation
McDonough, Molly; Perov, Polievkt; Johnson, Walter; and Radojev, Stevan, "Data Processing & Analysis for Atomic Force Microscopy (AFM)" (2020). Undergraduate Theses and Capstone Projects. 18.
https://dc.suffolk.edu/undergrad/18